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An optimised submicron Dual-Material gate (DM) GaAs-MESFETs design to improve the analog performance using multi-objective computation

机译:优化的亚微米双材料栅极(DM)GaAs-MESFET设计可使用多目标计算来提高模拟性能

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In the present paper, new modeling approach is developed to improve the electrical behavior of the submicron Dual-Material-gate (DM) Gallium Arsenide (GaAs)-MESFETs for analog applications. The electrical parameters such as transconductance, output conductance, current-voltage characteristics and drain to source resistance of the device have been determined and analytical expressions have been developed. The developed models are used to elaborate the objective functions. Analog electrical parameters are also built for the three points sampled from the different locations of the Pareto space, and an interpretation is presented for the Pareto relation between the small signal device behavior and the design parameters. Hence, the developed approach is explored to search for optimal dimensional and electrical parameters to get better electrical performance for analog circuit applications. The proposed models have been validated using 2-D numerical simulations (SILVACO).
机译:在本文中,开发了一种新的建模方法来改善用于模拟应用的亚微米双材料栅极(DM)砷化镓(GaAs)-MESFET的电性能。确定了电学参数,例如跨导,输出电导,电流-电压特性以及器件的漏极至源极电阻,并开发了解析表达式。所开发的模型用于阐述目标函数。还为从帕累托空间不同位置采样的三个点建立了模拟电参数,并给出了小信号设备行为与设计参数之间的帕累托关系的解释。因此,探索开发的方法来搜索最佳尺寸和电气参数,以获得用于模拟电路应用的更好的电气性能。所提出的模型已使用二维数值模拟(SILVACO)进行了验证。

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