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Performance evaluation of wide bandgap semiconductor technologies in automotive applications

机译:汽车应用中宽带隙半导体技术的性能评估

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摘要

This paper evaluates the commercially available semiconductor switch technologies for automotive applications. For this purpose, conventional Silicon (Si) Insulated Gate Bipolar Transistor (IGBT) is compared with wide bandgap Gallium Nitride (GaN) and Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET). Various design aspects of commercially available wide bandgap switches are introduced. Afterwards, experimental efficiency measurements for SRM drive systems using different semiconductor technologies are performed. Methods to improve performance of the automotive drive system are introduced.
机译:本文评估了汽车应用的市售半导体开关技术。为此目的,将传统的硅(Si)绝缘栅双极晶体管(IGBT)与宽带凝血镓(GaN)和碳化硅(SiC)金属氧化物半导体场效应晶体管(MOSFET)进行比较。介绍了各种商业上可获得的宽带隙开关的设计方面。然后,执行使用不同半导体技术的SRM驱动系统的实验效率测量。介绍了提高汽车驱动系统性能的方法。

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