Device for comprehensive analysis of leakage current paths in photovoltaic module packaging materials

摘要

Photovoltaic (PV) modules in high voltage systems are prone to power loss over time due to leakage current flowing through the module packaging materials. A device has been developed to measure impedances of individual paths of leakage current. This has made it possible to understand the contributions of materials and interfaces responsible for degradation. This was not possible earlier when only total leakage currents were being measured. Detailed analysis of the leakage current paths in the PV modules under high voltage bias is carried out over an extended period. Knowledge about dominant leakage current paths can be used to quantify the physical and chemical changes occurring within the module packaging materials.