Device for detailed analysis of leakage current paths in photovoltaic modules under high voltage bias

摘要

High voltages used in photovoltaic (PV) systems are known to induce long-term power loss in PV modules due to leakage current flowing through the module packaging materials. It has been difficult to identify the specific materials and interfaces responsible for degradation based on an analysis of only the total leakage current. A detailed investigation of the leakage current paths within the PV modules, under high voltage bias, is carried out by utilizing a device that measures the independent contributions of various paths in real-time. Knowledge about dominant leakage current paths can be used to quantify the physical and chemical changes occurring within the module packaging materials.