2 (CIS) thin films ~ 500-650 ? in thickness have been deposited on c-Si substrates by two-st'/>
copper compounds; critical points; elemental semiconductors; ellipsometry; energy gap; evaporation; indium compounds; semiconductor thin films; silicon; solar cells; ternary semiconductors;
机译:Y
机译:DC溅射光学常数衍生的ITO,TiO
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机译:实时光谱椭圆偏振法研究两阶段CuInSe
机译:光谱椭偏仪作为薄膜中光学,电学和结构特性的多功能,非接触式探针:在光伏中的应用
机译:椭圆偏振法在透明表面上薄膜的光学性质;接近临界角的覆膜表面的内部反射
机译:错误:“用光谱椭圆形测定法研究的无定形和结晶SB掺杂SnO2薄膜的光学性质:光学间隙能量和有效质量”J。苹果。物理。 118,085303(2015)