ENCAPSULATION INFLUENCE ON THE POTENTIAL INDUCED DEGRADATION OF CRYSTALLINE SILICON CELLS WITH SELECTIVE EMITTER STRUCTURES

摘要

The encapsulation method of crystalline silicon modules plays an important role in the mitigation ofpotential induced degradation (PID) on module level. The focus on this work is to identify possibilities of mitigatingPID for selective emitter cell technologies by the means of new module designs without the necessity of cell levelmodifications.In this paper we present different frontcover and encapsulation materials, which have been tested in different modulelayouts. We predominantly examined innovative laminate configurations allowing for higher transmission rates in theUV range and thus increasing short circuit currents (I_(SC)) of selective emitter cells. We examined these performance(P_(MPP)) enhancements consisting in higher optical transmission in relation to its resistance against PID. As a result ofthis assessment we show new module designs, which are both capable to improve module efficiencies while avoidingPID effects. Furthermore, different EVAs have been tested regarding their PID .