The New Analysis Method of Photo-Alignment Layers via Reflection Spectrometry

摘要

Photo-alignment is an advanced aligning technique for liquid crystal displays (LCD), but the analysis for its coating layer is not easy to do due to no obvious physical change on the surface. In this paper, we apply the fundamental quantum mechanics and optics knowledge to develop a new reflection spectrometer for analyzing the optical axis orientation of the photo-alignment layer and its degree of photo-aligning.