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CVD Diamond Films Growth on Silicon Nitride Inserts (Si_3N_4) with High Nucleation Density by Functionalization Seeding

机译:通过功能化接种在具有高成核密度的氮化硅插入物(Si_3N_4)上生长CVD金刚石膜

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Silicon Nitride is largely used as the base material to manufacture cutting tools. Due to its low thermal expansion coefficient it is ideal candidate for CVD diamond deposition. In this work, we functionalized the surface of silicon nitride inserts (Si_3N_4) with a polymer (PDDA - Poly (diallyldimethylamonium chloride - Mw 40000)) to promote seeding with nanodiamond particles. The seeding was performed in water slurry containing 4 nm diamond particles dispersed by PSS -Poly (sodium4-styrenesulfonate) polymer. CVD diamond films, with high nucleation density, were deposited in a hot filament reactor. Film morphology was characterized by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Diamond film quality was determined by Raman Spectroscopy. CVD diamond film adherence was evaluated using Rockwell C indentation.
机译:氮化硅被广泛用作制造切削工具的基础材料。由于其低的热膨胀系数,因此非常适合用于CVD金刚石沉积。在这项工作中,我们使用聚合物(PDDA-聚(二烯丙基二甲基氯化铵-Mw 40000))将氮化硅插入物(Si_3N_4)的表面功能化,以促进纳米金刚石颗粒的晶种。在包含通过PSS-聚(4-苯乙烯磺酸钠)聚合物分散的4 nm金刚石颗粒的水浆中进行晶种。具有高成核密度的CVD金刚石薄膜沉积在热灯丝反应器中。通过原子力显微镜(AFM)和扫描电子显微镜(SEM)表征膜的形态。金刚石膜的质量通过拉曼光谱法测定。使用Rockwell C压痕评估CVD金刚石膜的附着力。

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