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The COS FUV channel: on-orbit performance trends and early characterization of a new detector lifetime position

机译:COS FUV通道:在轨性能趋势和新探测器寿命位置的早期表征

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The Cosmic Origins Spectrograph (COS) was installed into the Hubble Space Telescope in May 2009, and has beencollecting ultraviolet spectra since then. The Far Ultraviolet channel of COS uses an efficient optical design and a two-segment,large-format Cross Delay Line microchannel plate detector to obtain spectra at medium and low resolution inthe far ultraviolet. While the overall instrument performance has been excellent, several long-term trends in performancehave been noted and are being addressed. These include a slow decrease in overall sensitivity, which is independent ofthe illumination and may be due to a degradation of the photocathode with time.In addition, the detector microchannel plates are showing severe gain sag in the regions where the most photons havefallen. As a result, we are in the process of moving the spectra to a new, nearly pristine, location on the detector. Thiswill be the first of several additional lifetime positions which will allow us to collect high-quality spectra for many yearsto come. We will discuss the factors that led to our decision on where to move next and our progress in moving there,including details of the enabling and calibration activities which are being performed at the new location, and theanticipated performance. We will also address strategies that will be implemented in order to prolong the life at this andsubsequent positions.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:宇宙起源光谱仪(COS)于2009年5月安装在哈勃太空望远镜中,此后一直在收集紫外线光谱。 COS的远紫外线通道采用高效的光学设计和两段式大幅面交叉延迟线微通道板检测器,可在远紫外线中获得中分辨率和低分辨率的光谱。尽管仪器的整体性能非常出色,但已经注意到并正在解决一些长期的性能趋势。这些包括总体灵敏度的缓慢降低,这与光照无关,并且可能是由于光电阴极随时间而退化。此外,检测器微通道板在光子下降最多的区域显示出严重的增益下垂。结果,我们正在将光谱移动到检测器上新近原始的位置。这将是其他几个终身职位中的第一个,这将使我们能够收集很多年以后的高质量光谱。我们将讨论决定下一步行动的因素以及下一步行动的进展,其中包括在新位置执行的启用和校准活动的详细信息以及预期的性能。我们还将讨论将要执行的策略,以延长该位置及其后位置的寿命。©(2012)版权所有,光电仪器工程师学会(SPIE)。摘要的下载仅允许个人使用。

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