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When good trigger circuits go bad: A case history

机译：当好的触发电路变坏时：案例历史

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A case history is presented of an advanced latched dual time constant ESD transient trigger circuit design. An unexpected failure occurred with this design which interfered with functional operation of the device. Analysis of the failure is presented along with successful circuit fixes and techniques that ensure safe operation of these circuits.

机译：介绍了先进的锁存双时间常数ESD瞬态触发电路设计的案例历史。此设计发生意外故障，从而干扰了设备的功能运行。将介绍故障分析以及成功的电路修复和确保这些电路安全运行的技术。

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《2011 33rd Electrical Overstress/Electrostatic Discharge Symposium 》|2011年|p.1-6|共6页
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Gerdemann Alex; Miller James W.; Stockinger Michael; Herr Norman; Dobbin Allan; Ricklefs Reyhan;
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中图分类电器 ;
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When good trigger circuits go bad: A case history

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