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HIGHLY SENSITIVE ORGANIC PHOTODETECTOR BASED ON SI/NIPCTS/PEDOT: PSS BULK HETROJUNCTION BLEND

机译:基于SI / NIPCTS / PEDOT的高度敏感的有机光电探测器:PSS散装Hetrojunction混合物

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摘要

This research reports on the fabrication and characterization of an Si/NiPcTs/PEDOT:PSS bulk hetrojunction blend with different (PEDOT:PSS) concentration. A thin film was deposited by spin coater deposition method on silicon wavers (Si) N-type direction (111) of thickness 100nm. The optical properties were studied by using UV-Vis absorption spectra and photoluminescence spectra (PL) at annealing temperature of wafer 100°C. The decreasing of the (PEDOT:PSS) concentration leads to increase absorbance of films with optical peak shifts position to low energy side of spectra. The values of optical energy gap of (NiPcTs/PEDOT:PSS) thin film between (1.6-1.8)eV for Q band and (2.75-3.2)eV for B band for direct energy band. The optical energy gap obtained from photoluminescence spectra for NiPcTs/PEDOT:PSS bulk heterojunctions blend thin films with excitation wavelength (338-352) nm is Very approach to energy gap obtained by UV-VIS spectrum. The current-voltage characteristics of the diode were measured at room temperature under dark and light condition. The detectivity and responsivity is very low with conc. 0.5 at 350nm and 550nm but disappear at 800 nm. The times values of Rise time were 0.75μsec, Transit time (400-500)μsec and Life time (160-180)usec.
机译:本研究报告了Si / Nipcts / PEDOT的制造和表征:PSS批量Hetrojunction混合物与不同(PEDOT:PSS)浓度混合。通过在厚度100nm的硅波动(Si)n型方向(111)上的旋转涂布机沉积方法沉积薄膜。通过在晶片100℃的退火温度下使用UV-Vis吸收光谱和光致发光光谱(PL)来研究光学性质。 (PEDOT:PSS)浓度的降低导致用光学峰值移位到光谱的低能量侧的薄膜的吸光度增加。 (NiPCTS / PEDOT:PSS)薄膜的光能间隙值(1.6-1.8)EV为Q带和(2.75-3.2)EV,用于直接能量带的B频段。从用于NiPCTS / PEDOT的光致发光光谱获得的光学能隙:PSS散装杂交共混薄膜具有激发波长(338-352)Nm的薄膜是通过UV-VIS光谱获得的能隙的方法。在暗和光条件下在室温下测量二极管的电流电压特性。响应性和响应度非常低,浓度非常低。 0.5,350nm和550nm,但在800 nm下消失。上升时间的时间值为0.75μsec,运输时间(400-500)μsec和寿命(160-180)USEC。

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