首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >PHASE STABILITY AND ELECTRONIC STRUCTURE OF NEW PHOTOVOLTAIC COMPOUNDS, Cu_2II-IVSe_4 (II: Zn, Cd, Hg, IV: Si, Ge, Sn)
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PHASE STABILITY AND ELECTRONIC STRUCTURE OF NEW PHOTOVOLTAIC COMPOUNDS, Cu_2II-IVSe_4 (II: Zn, Cd, Hg, IV: Si, Ge, Sn)

机译:新光伏化合物的相位稳定性和电子结构,Cu_2II-IVSE_4(II:Zn,Cd,Hg,IV:Si,Ge,Sn)

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We have theoretically evaluated phase stability and electronic structure of Cu_2II-IVSe_4 (II = Zn, Cd, Hg, IV = Si, Ge, Sn) and compared the results with those of Cu_2ZnSnSe_4 (CZTSe). The enthalpies of formation for kesterite (KS), stannite (ST) and wurtz-stannite (WST) phases of Cu_2II-IVSe_4 were calculated by first principles calculation. In Cu_2ZnIVSe_4 (IV =Si, Ge, and Sn), the KS phase is more stable than the ST and WST phases. On the other hand, in Cu_2IISnSe_4, (II = Cd and Hg), the ST phase is more stable than the KS and WST phases. The theoretical band gaps of KS-type Cu_2ZnSiSe_4 (1.48 eV) and Cu_2ZnGeSe_4 (1.10 eV) are wider than that of KS-type Cu_2ZnSnSe_4 (0.63 eV). The theoretical band gaps of ST-type Cu_2CdSnSe_4 (0.52 eV) and ST-type Cu_2HgSnSe_4 (0.07 eV) are smaller than that of KS-type Cu_2ZnSnSe_4 (0.63 eV). The valence band maximum (VBM) of Cu_2ZnIVSe_4 consists of an antibonding orbital of Cu 3d and Se 4p, while the conduction band minimum (CBM) consists of an antibonding orbital of IV ns and Se 4p. The VBMs of Cu 3d + Se 4p in Cu_2IISnSe_4 (II = Cd and Hg) and Cu_2ZnIVSe_4 (IV = Ge and Si) are similar to those in Cu_2ZnSnSe_4. Therefore, the energy levels of VBMs in Cu_2II-IVSe_4 do not change so much compared with those of CZTSe. On the other hand, the energy levels of CBMs of IV ns + Se 4p in Cu_2ZnSiSe_4 and Cu_2ZnGeSe_4 become higher than those in Cu_2ZnSnSe_4, while the energy levels of CBMs in Cu_2IISnSe_4 become lower than those in CZTSe.
机译:我们具有Cu_2II-IVSe_4(II = Zn,CD,Hg,IV = Si,Ge,Sn)的理论上评估的相位稳定性和电子结构,并将结果与​​Cu_2znsnse_4(CZTSE)进行比较。通过第一个原理计算计算kEtterite(Ks),斯坦替斯(ST),斯坦替斯(ST),氏型(ST)和Wurtz-stannite(WST)阶段的焓阶段的Cu_2II-IVSe_4。在CU_2ZNIVSE_4(IV = SI,GE和SN)中,KS相比ST和WST相更稳定。另一方面,在CU_2IISNSE_4中,(II = CD和HG),ST相比ks和WST相更稳定。 KS型CU_2ZNSISE_4(1.48eV)和CU_2ZNGESE_4(1.10eV)的理论带间隙比KS型CU_2ZNSNSE_4(0.63eV)宽。 ST型CU_2CDSNSE_4(0.52eV)和ST型CU_2HGSNSE_4(0.07eV)的理论带间隙小于KS型CU_2ZNSNSE_4(0.63eV)。 Cu_2Znivse_4的价带最大(VBM)由Cu 3D和Se 4P的抗抗烷基因组成,而导电带最小(CBM)由IV NS和SE 4P的抗抗抗体组成。 CU_2IISNSE_4(II = CD和HG)中CU 3D + SE 4P的VBMS和CU_2ZNIVSE_4(IV = GE和SI)类似于CU_2ZNSNSE_4中的VBM。因此,与CZTSE那些相比,CU_2II-IVSE_4中VBMS的能量水平不会改变如此多。另一方面,CU_2ZNSISE_4和CU_2ZNGESE_4中的IV NS + SE 4P的CBM的能量水平变得高于CU_2ZNSNSE_4中的CBMS,而CU_2IISNSE_4中的CBMS的能量水平变得低于CZTSE中的CBMS。

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