An Efficient Event Generation Method for Testing a SOC with Multiple Processing Elements and Associated Peripherals

摘要

For a time invariant system with finite possible events, the possible scenarios are defined by the relative delays between the events. For testing the system, all the nonredundant scenarios need to be generated and utilized. A simple random number generator is inefficient and generates redundant scenarios. In this work, we derive the non-redundant set of scenarios and then propose a method for generating the scenarios efficiently. The provision to control the time granularity of the events is also provided. An example of the method applied for testing a SOC with multiple processing elements and peripherals is given.