首页> 外文会议>2011 IEEE First Conference on Clean Energy and Technology >Investigation of buffer layers, front and back contacts for ZnxCd1−xS/CdTe photovoltaic
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Investigation of buffer layers, front and back contacts for ZnxCd1−xS/CdTe photovoltaic

机译:Zn x Cd 1-x S / CdTe光伏电池的缓冲层,前后触点的研究

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A numerical analysis has been performed utilizing Analysis of Microelectronic and Photonic Structures (AMPS 1D) simulator to explore the possibility of higher efficiency and stable ZnxCd1−xS/CdTe cells. Several cell structures with indium tin oxide (ITO) and cadmium stannate (Cd2SnO4) as front contact, zinc stannate (Zn2SnO4) and zinc oxide (ZnO) as buffer layer and antimony telluride (Sb2Te3) insertion with Nickle (Ni) as back contact has been investigated in the conventional (SnO2/CdS/CdTe/Ag) CdTe cell structures in which CdS is replaced by zinc cadmium sulphide (ZnxCd1−xS) as window layer. Efficiency as high as 18.0% has been found with 80 nm of ZnxCd1−xS window layer for x=0.05, 1 µm of CdTe layer and 100 nm Zn2SnO4 buffer layer without Sb2Te3 back contact. However, ZnO insertion shows low conversion efficiency of 7.84% and 12.26%, respectively with and without Sb2Te3 back contact. It has been found that 1 µm of CdTe absorber layer, 70 nm of ZnxCd1−xS (x=0.05) window layer, 100 nm of Zn2SnO4 buffer layer and 100 nm Sb2Te3 back contact layer are sufficient for high efficiency (>17.5%) ZnxCd1−xS/CdTe cells. Moreover, it was found that the cell normalized efficiency linearly decreases with the increasing operating temperature at the temperature gradient of −0.25%/°C.
机译:利用微电子和光子结构分析(AMPS 1D)仿真器进行了数值分析,以探索更高效率和稳定Zn x Cd 1-x S / CdTe的可能性细胞。以锡铟氧化物(ITO)和锡酸镉(Cd 2 SnO 4 )为前接触,锡酸锌(Zn 2 SnO)的几种电池结构 4 )和氧化锌(ZnO)作为缓冲层,并插入镍(Ni)作为背接触点的碲化锑(Sb 2 Te 3 )在传统的(SnO 2 / CdS / CdTe / Ag)CdTe电池结构中进行了研究,其中CdS被硫化锌(Zn x Cd 1 -x S)作为窗口层。对于x = 0.05的Zn x Cd 1-x S窗口层,发现80 nm的效率高达18.0%,CdTe层为1 µm,Zn为100 nm没有Sb 2 Te 3 背接触的 2 SnO 4 缓冲层。然而,在有和没有Sb 2 Te 3 背接触的情况下,ZnO插入均显示出低的转换效率,分别为7.84%和12.26%。已经发现,1μm的CdTe吸收层,70nm的Zn x Cd 1-x S(x = 0.05)窗口层,100nm的Zn 2 SnO 4 缓冲层和100 nm Sb 2 Te 3 背接触层足以实现高效率(> 17.5% )Zn x Cd 1-x S / CdTe细胞。此外,发现在-0.25%/℃的温度梯度下,电池归一化效率随着工作温度的增加而线性降低。

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