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Performance of Piezoelectrets Made of Non-porous Polytetrafluoroethylene and Fluoroethylenepropylene Layers

机译:无孔聚四氟乙烯和氟乙烯丙烯层制成的压电驻极体的性能

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The thermal stability of piezoelectric d_33 coefficients and charge dynamics in the piezoelectret films with tailored microstructure, made of non-porous polytetrafluoroethylene (PTFE) and fluoroethylenepropylene (FEP) layers, are investigated by the measurements of the isothermal decay of piezoelectric dn coefficients at elevated temperatures and the analysis of thermally stimulated discharge (TSD) current spectra in short circuit, respectively. The results show that the quasi-static piezoelectric c/33 coefficient up to 300 pC/N is achieved and its Young's modulus is about 0.28 MPa. The c/33 values in the present studied films show improved thermal stability compared with the films without regular microstructure. The drift path for the most of detrapped charges in the films is through the solid dielectric layer.
机译:通过测量高温下压电dn系数的等温衰减,研究了由无孔聚四氟乙烯(PTFE)和氟乙烯丙烯(FEP)层制成的具有定制微结构的压电驻极体薄膜中压电d_33系数的热稳定性和电荷动力学并分别分析了短路时的热激励放电(TSD)电流谱。结果表明,准静态压电c / 33系数达到300 pC / N,其杨氏模量约为0.28 MPa。与没有规则微观结构的薄膜相比,本研究薄膜中的c / 33值显示出改善的热稳定性。薄膜中大部分已俘获电荷的漂移路径是通过固体介电层。

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