Compression-aware capture power reduction for at-speed testing

摘要

Test compression has become a de facto technique in VLSI testing. Meanwhile, excessive capture power of at-speed testing has also become a serious concern. Therefore, it is important to co-optimize test power and compression ratio in at-speed testing. In this paper, a novel X-filling framework is proposed to reduce capture power of both LoC and LoS at-speed testing, which is applicable for different test compression schemes. The proposed technology has been validated by the experimental results on larger ITC'99 benchmark circuits.