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Evaluation of Hall Effect in Micro Poly-Si Hall Devices to Analyze Electron Transport in poly-Si films

机译:评估微型多晶硅霍尔器件中的霍尔效应以分析多晶硅薄膜中的电子传输

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Hall effect in micro poly-Si Hall devices has been evaluated to analyze electron transport in poly-Si films. It is observed that the Hall voltage (VH) has offset voltage (Vo) even when magnetic field (B) is zero whereas the change of Vh (AVh) is proportional to B. The polarities of both Vo and AVH are reversed when the direction of the control current is reversed. This means that Vo is caused by not the potential barrier at the grain boundaries but the zigzag path of the electron transport.
机译:已对微型多晶硅霍尔器件中的霍尔效应进行了分析,以分析多晶硅膜中的电子传输。可以看出,即使磁场(B)为零,霍尔电压(VH)仍具有偏移电压(Vo),而Vh(AVh)的变化与B成正比。的控制电流反向。这意味着Vo不是由晶界处的势垒引起的,而是由电子传输的之字形路径引起的。

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