首页> 外文会议>ICIRA 2010;International conference on intelligent robotics and applications >Scale Invariant Feature Transform (SIFT) Parametric Optimization Using Taguchi Design of Experiments
【24h】

Scale Invariant Feature Transform (SIFT) Parametric Optimization Using Taguchi Design of Experiments

机译:使用田口实验设计的尺度不变特征变换(SIFT)参数优化

获取原文

摘要

Traditional SIFT methods require a priori of object knowledge in order to complete accurate feature matching. The usual means is via trained databases of objects. In order to be able to get the pose of an object, accurate object recognition is required. Without accurate object recognition, detection can occur but no information about 3-D location will be available. The goal of this work is to improve object recognition using SIFT by optimizing algorithm parameters with respect to the mean angle between matched points (μ_(amp)) found within a scene via multiple images, which can then be used to determine the object pose. Good parameters are needed so that the SIFT algorithm is able to control which matches are accepted and rejected. If keypoint information about an object is wrongly accepted, pose estimation is inaccurate and manipulation capabilities in a 3-D work space will be inaccurate. Using optimized SIFT parameter values results in a 19% improvement of μ_(AMP)-Optimal in comparison toμ_(AMP)-Experimental.
机译:传统的SIFT方法需要先验的对象知识才能完成精确的特征匹配。通常的方法是通过训练有素的对象数据库。为了能够获得物体的姿势,需要精确的物体识别。如果没有准确的物体识别,可能会发生检测,但是无法获得有关3-D位置的信息。这项工作的目的是通过针对多个图像中的场景中找到的匹配点之间的平均角度(μ_(amp))的平均角度优化算法参数,从而改善SIFT的物体识别能力,然后将其用于确定物体姿态。需要良好的参数,以便SIFT算法能够控制接受和拒绝哪些匹配。如果错误地接受了有关对象的关键点信息,则姿势估计将不准确,并且3-D工作空间中的操纵功能将不准确。与之相比,使用优化的SIFT参数值可将μ_(AMP)-Optimal改善19% μ_(AMP)-实验。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号