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Dependence of IGBT Junction-Case Steady State Thermal Resistance on Heating Current

机译:IGBT结壳稳态热阻与加热电流的关系

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High heating current dependence of the IGBT module junction-case steady state thermal resistance is investigated. The conception of the thermal resistance and the physical structure of the IGBT module and the thermal impedance test principle are briefly introduced. The junction-case thermal resistance can be deduced by Finite Element Method in the numerical simulator ANSYS. The transient thermal impedance curve and the junction-case steady state thermal resistance of a certain type of IGBT are obtained by the thermal resistance test experiments. It's found that the junction-case steady state thermal resistance decreased when the heating current increased. When the high heating current reaches a certain level, the steady state thermal resistance becomes a constant.
机译:研究了IGBT模块的结壳稳态热阻对高加热电流的依赖性。简要介绍了IGBT模块的热阻概念和物理结构以及热阻测试原理。接线盒的热阻可以通过有限元方法在数值仿真器ANSYS中推导出来。通过热阻测试实验,得到了某类IGBT的瞬态热阻曲线和结壳稳态热阻。发现随着加热电流的增加,结壳稳态热阻降低。当高加热电流达到一定水平时,稳态热阻变得恒定。

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