A Boundary-Scan Test Bus Controller Design for Mixed-Signal Test

摘要

IEEE Std 1149.4 has been widely adopted in the mixed signal circuits’ test and fault diagnosis. Successful application of this important standard will depend on the availability of test structures, strategies and boundary scan test bus controller. A novel boundary scan test bus controller design for mixed-signal test is presented in this paper. The uniquely designed test hardware provides the accesses not only needed for measurements of the Circuit Under Test’s (CUT) analog and digital portion, but also used to interaction with the outside. A new integrated software structure has been developed to automatically generate functional tests for target boards. The proposed design is verified by experiments and can reduce test cost and time to market significantly in comparison with the existing techniques for mixed signal board testing.