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High performance Flash memory for 65 nm embedded automotive application

机译:适用于65 nm嵌入式汽车应用的高性能闪存

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摘要

In this paper the results obtained for a new process flow that integrates a high performance flash cell for automotive application with a state of the art 65nm CMOS have been presented. Despite the several specific process steps introduced for the first time on embedded technologies, the MOS performances have not been impacted by the integration of the Flash cell and the related HV MOS and the results obtained on a 4Mbit Flash array are very promising.
机译:在本文中,介绍了一种新工艺流程的结果,该工艺流程将用于汽车应用的高性能闪存单元与最先进的65nm CMOS集成在一起。尽管首次针对嵌入式技术引入了几个特定的​​处理步骤,但是MOS单元的性能并未受到Flash单元和相关HV MOS集成的影响,并且在4Mbit Flash阵列上获得的结果是非常有希望的。

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