Photoreflectance spectroscopy with a Fourier-transform infrared spectrometer: From visible to far infrared

摘要

Recent progress in photoreflectance spectroscopy at the Shanghai Institute of Technical Physics was reviewed, with the focus on the extension of functional spectral range for the first time from 5 μm to FIR of 20 μm and the application to narrow-gap semiconductors and nanostructure materials.