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Wide-bandwidth 60 GHz differential LNA in SiGe:C technology

机译:SiGe:C技术的宽带60 GHz差分LNA

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This paper presents the differential LNA design for unlicensed 60 GHz band. The architecture is elaborated in conjunction with process-related effects (ground slits) in order to minimize the modeling errors and enhance the performance. The differential test LNA is fabricated in IHP SG25H1 high performance 0.25 μm BiCMOS SiGe:C technology. On wafer measurement results have shown the gain of 24.5 dB with more than 10 GHz operational bandwidth. Power consumption of less than 60 mW is observed. Average in-band noise figure of 5.95 dB with a minimum of 5.3 dB was measured.
机译:本文介绍了针对免许可60 GHz频段的差分LNA设计。结合与过程相关的效果(接地缝)对体系结构进行了详细说明,以最大程度地减少建模错误并提高性能。差分测试LNA采用IHP SG25H1高性能0.25μmBiCMOS SiGe:C技术制造。在晶圆上的测量结果表明,在超过10 GHz的工作带宽下,增益为24.5 dB。观察到功耗小于60 mW。测得的平均带内噪声系数为5.95 dB,最小值为5.3 dB。

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