The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode

摘要

Electric potential mapping of degraded dielectric layers of multilayer ceramic capacitors (MLCCs) was carried out using Kelvin probe force microscopy in order to clarify their degradation mechanism under conditions of an accelerated lifetime test condition. In the cross sections of the degraded and as-prepared dielectric layers, a significant electric field concentration was found in the vicinity of the anode of the degraded dielectric layer, in contrast to a homogeneous concentration found throughout layers of the samples before the accelerated lifetime test.