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Plasma Enhanced CVD and Plasma Chemical Etching at Atmospheric Pressure for Continuous Processing of Crystalline Silicon Solar Wafers

机译:常压等离子体增强CVD和等离子体化学刻蚀,用于连续处理结晶硅太阳能晶片

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Atmospheric pressure plasma technologies are a potential substitution for wet chemical and vacuum processes for production of crystalline silicon solar cells, leading to a simplified in-line processing chain. Plasma chemical etching and deposition technologies are developed as a basis for a future continuous production process. At Fraunhofer IWS a linearly extended DC are discharge and a microwave plasma source are used for activation of the processing gases. An Ar-N_2 mixture is fed through the plasma source; etch gases or precursors are injected into the activated plasma gases outside of the plasma source, near the substrate. Controlled purge gas systems prevent the contamination of the reaction zone with air or moisture as well as the release of reaction products. Etching rates up to 12 μm/min are realized; in dependence of etch gas composition and plasma conditions. The texture of the wafer surface can be controlled; on nano-structured Si surfaces the diffuse reflection was reduced to 10 %. First industrial tests confirmed standard efficiencies of cells after edge isolation by atmospheric pressure plasma etching. Passivation properties of silicon nitride layers are comparable to low pressure PECVD reference films.
机译:大气压等离子体技术可以替代湿法化学和真空工艺来生产晶体硅太阳能电池,从而简化了在线工艺链。等离子体化学蚀刻和沉积技术的发展是未来连续生产过程的基础。在Fraunhofer IWS,线性扩展的DC放电,并且微波等离子体源用于激活处理气体。将Ar-N_2混合物送入等离子体源;蚀刻气体或前驱物被注入到等离子体源外部,基板附近的活化等离子体气体中。受控的吹扫气系统可防止反应区被空气或湿气污染以及反应产物的释放。刻蚀速率高达12μm/ min;取决于蚀刻气体成分和等离子体条件。晶圆表面的纹理可以控制;在纳米结构的硅表面上,漫反射降低到10%。首次工业测试证实了通过大气压等离子体蚀刻进行边缘隔离后,电池的标准效率。氮化硅层的钝化性能与低压PECVD参考膜相当。

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