Optimal Design Approach for Accelerated Life Test of Electronic Equipments

摘要

This paper analyzes the electrical connector's failure mechanism and lifetime model under the combination of temperature stress and vibration stress. And it is helpful for transformed stresses to conveniently get the linear extreme-value distribution and its parameter estimates. Using maximum likelihood estimate (MLE), the asymptotic variances of extrapolated lifetime quantile P at the normal stress level is the objective function to be optimized. So the optimal accelerated life test design model is established, which considers some constraint conditions and uniform orthogonal design requirements. Then the optimal test plan is given simulation evaluate by Monte-Carlo method. The design approach provided in this paper is available for constant stress accelerated life test of electronic equipment. And Numerical example shows that the optimal test plan can reduce example numbers and test cost and shorten test time.