AUGMENTING FIELDED TEST SYSTEMS WITH DIAGNOSTIC REASONER TECHNOLOGY

摘要

This paper will show how diagnostic reasoner technology can be used in the automated test industry. It will briefly explain how diagnostic reasoners can reduce overall logistics support costs by reducing test time and more accurately identifying failed components. It is believed that diagnostic reasoner technology can be applied to both new and legacy Test Program Sets (TPSs) and test systems. The paper will describe some issues and lessons learned while integrating with legacy components and will provide some recommendations that should be considered when designing new test systems and TPSs.