首页> 外文会议>Proceedings of 2008 international conference on electronic packaging technology high density packaging (ICEPT-HDP 2008) >Meeting Thermal Performance and Reliability Challenges for a Thermally Enhanced Ball Grid Array Package (TEBGA)
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Meeting Thermal Performance and Reliability Challenges for a Thermally Enhanced Ball Grid Array Package (TEBGA)

机译:通过热增强的球栅阵列封装(TEBGA)应对热性能和可靠性挑战

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摘要

For devices with challenging power management requirement, thermally enhanced ball grid array package (TEBGA) offers a good solution, where the device is attached to a heat spreader, usually made of copper, with a thermally conductive epoxy to ensure a good conductive path for heat to escape from the die. The top die surface and bonding wires are covered with an overmolding compound for environmental protection such that heat dissipation is typically limited in that direction.However, TEBGA is not without its unique challenges.In this paper, we present a study on the challenges of meeting the thermal performance and reliability requirements for a ASIC packaged with TEBGA. A localized deformation or "dimple" of the TEBGA package is discovered during the package assembly process, where the heat-spreader is noted to have deformed under the die shadow, which results in a circular shaped indentation. This raises concerns about the impact on the thermal performance of the subsequent package to heat sink interface when it is integrated into the system. Solution to this potential problem rests on balancing thermal performance, reducing package stress level & understanding potential long term package reliability.Deformation of the package with each process step will be first described and particular attention will be given to the change of package profile after the die attach process; then a finite element analysis of the stress and deformation of the die attach process is discussed and important parameters affecting the deformation and stress are shown; moreover, a thermal resistance model assessing the thermal budget for this package in a system environment is reviewed and confirmation with numerical analysis & validation by experimental analysis are highlighted; furthermore, an interactive analysis is subsequently performed based on the FEA model for package stress/deformation and thermal resistance model to optimize the packaging solution; finally,balanced solution through this interactive optimization process is summarized and demonstrated in the manufacturing process.
机译:对于具有挑战性的电源管理要求的设备,热增强球栅阵列封装(TEBGA)提供了一个很好的解决方案,该设备通过导热环氧树脂连接到通常由铜制成的散热器上,以确保良好的导热路径从死里逃脱。上模表面和键合线都覆盖有用于保护环境的包覆成型化合物,因此通常在该方向上限制散热。但是,TEBGA并非没有其独特的挑战。 TEBGA封装的ASIC的热性能和可靠性要求。在封装组装过程中发现TEBGA封装的局部变形或“凹痕”,在该处,散热器在模具阴影下变形,从而形成圆形凹口。当集成到系统中时,这引起了对后续封装到散热器接口的热性能的影响的担忧。解决此潜在问题的方法是平衡热性能,降低封装应力水平并了解潜在的长期封装可靠性。首先将介绍每个工艺步骤中封装的变形,并特别注意模具后封装轮廓的变化。附加过程;然后讨论了芯片贴装过程中应力和变形的有限元分析,并显示了影响变形和应力的重要参数;此外,评估了在系统环境中评估该封装的热预算的热阻模型,并着重进行了数值分析和实验分析验证的确认;此外,随后基于FEA模型对包装应力/变形和热阻模型进行交互分析,以优化包装解决方案;最后,在制造过程中总结并论证了通过这种交互式优化过程得到的平衡解决方案。

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