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Study on the Integrated Quality Information Systems of Semiconductor Packaging Processes

机译:半导体封装工艺集成质量信息系统研究

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Based on the study of the processes of semiconductor packaging, three integration models were put forward. One is a static integration model based on the products, materials, specifications and devices. The other is a dynamic model based on the manufacturing orders and the manufacturing processes. The third one is an integration model of all kinds of quality tools based a central database, the quality tools include SPG ( Statistical Process Control) , Design of Experiment (DOE) , MSA (Measurement System Analysis) , et al. Based on these models, a framework of integrated quality information system for semiconductor packaging is studied. Through this framework, large-scale quality data, manufacturing processes and the quality tools can be integrated effectively. At last, a prototype was developed based on SQL Server2000 and Microsoft visual sutdio. net
机译:在对半导体封装工艺进行研究的基础上,提出了三种集成模型。一种是基于产品,材料,规格和设备的静态集成模型。另一个是基于制造订单和制造过程的动态模型。第三个是基于中央数据库的各种质量工具的集成模型,质量工具包括SPG(统计过程控制),实验设计(DOE),MSA(测量系统分析)等。基于这些模型,研究了用于半导体封装的集成质量信息系统的框架。通过该框架,可以有效地集成大规模质量数据,制造过程和质量工具。最后,基于SQL Server2000和Microsoft visual sutdio开发了一个原型。网

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