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RADIATION TOLERANCE OF AIInGaP AS A NEW TOP CELL FOR SUPER-HIGH EFFICIENCYMJ SPACE CELLS

机译:AIInGaP的辐射耐受性作为超高效空间细胞的新的顶级细胞

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30keV proton irradiation effects on AlInGaP solar cell as a new top cell for high efficiency III-V multi-junction (MJ) space solar cells are presented here for the first time. As the proton fluence increases over 1×1010cm-2, the Pmax and FF of the cell decrease rapidly, and the short-circuit current increases above the initial value interestingly, which is attributed to the broadening of depletion layer by the majority-carrier removal, at the fluence of 1×1010cm-2. From the changes in minority-carrier diffusion length (L) determined by the quantum efficiency modeling as a function of fluence, the damage constant KL for AlInGaP cell was estimated to be about 4.3×10-5. This value is lower than those observed in 3MeV proton irradiated InGaP, InGaAsP, and InGaAs cells. The maximum power recovery of the cell was observed by the minority-carrier injection enhanced annealing (1 A/cm2), and the annealing activation energy of 30keV proton irradiation-induced defects was determined as ΔE=0.42eV.
机译:本文首次介绍了30keV质子辐照对AlInGaP太阳能电池的影响,作为高效III-V多结(MJ)空间太阳能电池的新型顶层电池。当质子注量增加到1×1010cm-2以上时,电池的Pmax和FF迅速减小,并且短路电流有趣地增加到初始值以上,这归因于通过去除多数载流子使耗尽层变宽,通量为1×1010cm-2。根据量子效率模型确定的少数载流子扩散长度(L)的变化与注量的关系,AlInGaP电池的损伤常数KL约为4.3×10-5。该值低于在3MeV质子辐照的InGaP,InGaAsP和InGaAs电池中观察到的值。通过少数载流子注入增强退火(1A / cm 2)观察到电池的最大功率恢复,并且确定30keV质子辐照引起的缺陷的退火活化能为ΔE= 0.42eV。

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