Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

摘要

Interfacial atomic and electronic structures of Cu/Al_2O_3(0001) and Cu/Al_2O_3(1120) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al_2O_3 systems.