Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation using a Synchrotron X-ray Source

摘要

In-situ measurement of local orientation and strain Has Been carried out for a copper-polycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.