首页> 外文会议>Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers >An ultra low phase noise GSM local oscillator in a 0.09 μm standard digital CMOS process with no high-Q inductors
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An ultra low phase noise GSM local oscillator in a 0.09 μm standard digital CMOS process with no high-Q inductors

机译:采用0.09μm标准数字CMOS工艺的超低相位噪声GSM本地振荡器,无高Q电感器

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A design approach is presented for realizing a fully integrated local oscillator, covering all 4 GSM bands, and fulfilling the stringent phase noise requirement of -162 dBc/Hz at a 20-MHz offset from a 915-MHz carrier in a 1.4-V 0.09-μm digital CMOS process. By operating a digitally-controlled oscillator at a 4× frequency followed by ÷ 4 frequency dividers, the requirements of on-chip inductor Q and the amount of gate oxide stress are relaxed. Both dynamic and SCL dividers are also studied for their phase noise performance. It was found that a dynamic divider is needed for stringent TX outputs while an SCL divider can be used for RX to save power. Both dividers are capable of producing a tight relation between 4 quadrature output phases at low voltage and low power.
机译:提出了一种设计方法,用于实现一个覆盖所有4个GSM频段的完全集成的本地振荡器,并在1.4V 0.09的情况下,相对于915MHz载波的20MHz偏移,满足严格的-162 dBc / Hz的相位噪声要求。 -μm数字CMOS工艺。通过使数字控制的振荡器以4x频率运行,随后是÷4分频器,可以放松对片上电感器Q和栅极氧化应力的要求。还研究了动态和SCL分频器的相位噪声性能。已经发现,严格的TX输出需要动态分频器,而SCL分频器可以用于RX以节省功耗。两个分压器均能够在低电压和低功率情况下在4个正交输出相位之间产生紧密的关系。

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