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Modified Stranski-Krastanov Growth in Stacked Layers of Self-Assembled Cubic GaN/AlN Quantum Dots

机译:自组装立方GaN / AlN量子点堆叠层中Stranski-Krastanov的修正生长

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摘要

In a stacked structure of cubic GaN/AlN islands grown in a Stranski-Krastanov mode, the critical thickness for the GaN islanding (2D-3D transition) decreases by a factor of up to 10 between the initial dot layer and the third one. This variation of the critical thickness is strongly dependent on the AlN spacer thickness. Moreover, we observe systematically a change of the quantum dot strain state and an increase of island size, depending on the GaN island layer number.
机译:在以Stranski-Krastanov模式生长的立方GaN / AlN岛的堆叠结构中,GaN岛(2D-3D跃迁)的临界厚度在初始点层和第三点之间降低了多达10倍。临界厚度的这种变化很大程度上取决于AlN隔离层的厚度。此外,我们有系统地观察到量子点应变状态的变化和岛尺寸的增加,这取决于GaN岛的层数。

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