CONTACT RESISTIVITY AT GRTOLINE/ITO INTERFACE IN LAMINATED GRID CELL DETERMINED BY ISCRA METHOD

摘要

Standard TLM method is corrected with allowance made for the influence of finger's longitudinal resistance and also for the influence of fingers located between the measuring fingers. It is shown that the contact resistivity measured without regard for the above-mentioned factors can be underestimated as well as overestimated as much as even order of magnitude. ISCRA method for contact resistivity measuring is developed, which compared even with corrected TLM method allows to determine the contact resistivity for each finger. Contact resistivity at Gridline/ITO interface in Laminated Grid solar cell obtained by ISCRA method is less than 0,8 mΩ·cm~2, about an order of magnitude better compared with contact resistivity in screen-printed cells. This result leads to series resistance of less than 0,6Ω·cm~2 and ～3% shadow area of metallisation in full size bifacial Laminated Grid solar cells with high-efficiency emitter (～150Ω/□), or two times better than in screen-printed cells.