Fault models and test generation for IDDQ testing

摘要

This paper surveys recent research related to IDDQ testing, particularly focuses on fault models and test generation methods. (1) The paper provides a taxonomy of fault models that have been studied in literature, and classifies these models into a small set of faults. (2) The paper describes efficient test generation methods and fault simulation methods. Test compaction methods, including reduction of the total number of test vectors and selection of IDDQ measurement vectors, are also described.