Film-thickness Dependence of Anomalous Dielectric Property Found in C-Axis-Oriented La_(2-x)Sr_xCuO_4 Film with Localization

摘要

Besides the fractional doping-level dependence of the anomalous negative dielectric constant in La_(2-x)Sr_xCuO_4 film at xapprox approx 1/2n (n, integer), we find cyclic film-thickness dependence of the dielectric constant, where is used c-axis-oriented film with localization introduced by controlled oxygen deficiency. Using the FQHE model, we can explain the cyclic thickness dependence as the geometrical resonance based on "charge domain" structure.