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Effective low power microwave plasma CVD of carbon nitride films

机译:氮化碳膜的有效低功率微波等离子体CVD

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A new type of microwave plasma source was applied for high rate low power PE CVD of carbon nitride films. The source is based on a modified waveguide surfatron where the plasma slab is substituted by a metallic antenna. This original arrangement allows to generate a ball-shaped plasma, located at the tip of the antenna close to the substrate surface, at very low microwave powers. The tubular antenna served as an inlet of the gas ixture consisting of nitrogen and acetlyene. Films were deposited through a circular window of 2 (or 3) cm in diameter onto Si, Al, glass, plastics and paper substrates. The film depsotion rates were about 1 mu m/ming already at 10 W of the absorbed microwave power. Maximum rates exceeding 3 mu m/min wer reached at 30 W with slight dependence on the substrate temperature. FIlm properties dependen on both the gas mixture and the substrate temperature. The XRD and soft X-ray spectra of 10 mu m thick C-N films deposited at temperatures below 400 deg C fonfirm an amorphous structure. However, the polycrystalline C-N phase were detected in hard films deposited at higher temperatures. Main features of the deposition processes are discussed with respect to the film properties.
机译:一种新型的微波等离子体源被用于氮化碳膜的高速率低功率PE CVD。辐射源基于改进的波导超音速飞行器,其中等离子体平板由金属天线代替。这种原始布置允许以非常低的微波功率产生球形等离子体,该球形等离子体位于天线的靠近基板表面的尖端。管状天线用作由氮气和乙炔组成的气体混合物的入口。膜通过直径为2(或3)cm的圆形窗口沉积在Si,Al,玻璃,塑料和纸质基材上。在吸收的微波功率为10 W的情况下,薄膜的沉积速率约为1微米/分钟。在30 W时,最大速率超过3μm/ min,对衬底温度的影响很小。膜的性质取决于气体混合物和基材的温度。在低于400摄氏度的温度下沉积的10微米厚的C-N薄膜的XRD和软X射线光谱证实为非晶态结构。但是,在较高温度下沉积的硬膜中检测到多晶C-N相。关于膜的性质,讨论了沉积工艺的主要特征。

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