Attenuated Total Reflectance Ftir Microscopy As An Analytical

摘要

Fourier Transform InfraRed (FTIR) microscopy has proven useful in characterizing contaminants as small as 50 microns in diameter in resins and cured films as well as characterizing cured film surfaces. The keys to successful use of FTIR microscopy are experience in sample preparation, an understanding of light microscopy, and ingenuity in defining solutions. Examples are given of various problems that have been resolved using the attenuated total reflectance FTIR microscope technique.