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Ensemble Monte Carlo Calculation of the Hole Initiated Impact Ionization Rate in Bulk GaAs and Silicon Using a k- Dependent, Numerical Transition Rate Formulation

机译:使用k依赖的数值跃迁速率公式,对块状GaAs和硅中空穴引发的碰撞电离率进行了集成蒙特卡罗计算

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The hole initiated impact ionization rate in bulk silicon and GaAs is calculated using a numerical formulation of the impact ionization transition rate incorporated into an ensemble Monte Carlo simulation. The transition rate is calculated from Fermi's golden rule using a two-body screened Coulomb interaction including a wavevector dependent dielectric function. It is found that the effective threshold for hole initiated ionization is relatively soft in both materials, that the split-off band dominates the ionization process in GaAs, and that no clear dominance by any one band is observed in silicon, though the rate out of the light hole band is greatest.
机译:整体硅和GaAs中空穴引发的碰撞电离速率是使用整合到整体Monte Carlo模拟中的碰撞电离跃迁速率的数值公式来计算的。跃迁速率是根据费米的黄金法则,使用包括与波矢有关的介电函数的两体屏蔽库仑相互作用来计算的。发现在两种材料中,空穴引发电离的有效阈值都相对较弱,在GaAs中,分离带主导了电离过程,并且在硅中未观察到任何一个带的明显优势,尽管光孔带最大。

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