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Spectral Analyses and Radiation Exposures from Several Ground-Level Enhancement (GLE) Solar Proton Events: A Comparison of Methodologies

机译:几个地面增强(GLE)太阳质子事件的光谱分析和辐射暴露:方法学比较

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Several methods for analyzing the particle spectra from extremely large solar proton events, called Ground-Level Enhancements (GLEs), have been developed and utilized by the scientific community to describe the solar proton energy spectra and have been further applied to ascertain the radiation exposures to humans and radio-sensitive systems, namely electronics. In this paper 12 GLEs dating back to 1956 are discussed, and the three methods for describing the solar proton energy spectra are reviewed. The three spectral fitting methodologies are EXP [an exponential in proton rigidity (R)], WEIB [Weibull fit: an exponential in proton energy], and the Band function (BAND) [a double power law in proton rigidity]. The EXP and WEIB methods use low energy (MeV) GLE solar proton data and make extrapolations out to ~1 GeV. On the other hand, the BAND method utilizes low- and medium-energy satellite solar proton data combined with high-energy solar proton data deduced from high-latitude neutron monitoring stations. Thus, the BAND method completely describes the entire proton energy spectrum based on actual solar proton observations out to ~10 GeV. Using the differential spectra produced from each of the 12 selected GLEs for each of the three methods, radiation exposures are presented and discussed in detail. These radiation exposures are then compared with the current 30-day and annual crew exposure limits and the radiation effects to electronics.
机译:科学界已经开发出了几种用于分析来自超大型太阳质子事件的粒子光谱的方法,称为地平面增强(GLE),用于描述太阳质子的能谱,并已进一步用于确定辐射暴露量。人类和对辐射敏感的系统,即电子设备。本文讨论了可追溯到1956年的12个GLE,并综述了描述太阳质子能谱的三种方法。三种频谱拟合方法是EXP [质子刚度(R)的指数],WEIB [Weibull拟合:质子能量的指数]和Band函数(BAND)[质子刚度的双幂定律]。 EXP和WEIB方法使用低能量(MeV)的GLE太阳质子数据,并外推至〜1 GeV。另一方面,BAND方法结合了从高纬度中子监测站推导出的中低能卫星太阳质子数据和高能太阳质子数据。因此,BAND方法根据实际太阳质子观测值(约10 GeV)完全描述了整个质子能谱。对于这三种方法,分别使用从12个选定的GLE中的每一个产生的差分光谱,详细介绍并讨论了辐射暴露。然后将这些辐射暴露与当前30天和每年机组人员的暴露极限以及对电子设备的辐射影响进行比较。

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