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A new method for tapered open-ended coaxial line probe in determining relative complex permittivity at radio and microwave frequencies

机译:锥形开放式同轴线探头的一种新方法,用于确定无线电和微波频率下的相对复介电常数

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The measurement of complex permittivity of dielectric materials using coaxial line reflection methods at radio and microwave frequencies is of great interest. Peoples in basic and applied research areas as well as those in industry have an increasing requirement on the knowledge of the dielectric properties of materials. Based on coaxial line reflection methods, different probes employing various sizes and shapes are supposed and investigated[1]. Some of these methods have certain high requests on the configurations of the test samples. The dielectric properties of air and other materials are different and reflected microwaves are so sensitive to the dielectric properties of the materials under test that any small gap between samples and probes will cause measurement errors. The difficulties in preparing the samples lie in the necessity of precise cutting and machining. This cause researchers to find new probes which are easy to produce, have low requests on the preparation of samples and have tight contact between probes and samples[2∼4].
机译:使用同轴线反射法在无线电和微波频率下测量介电材料的复介电常数引起了人们的极大兴趣。基础和应用研究领域的人们以及工业领域的人们对材料介电特性的知识的要求越来越高。基于同轴线反射法,设想并研究了采用各种尺寸和形状的不同探头[1]。这些方法中的一些对测试样品的配置有很高的要求。空气和其他材料的介电特性不同,反射的微波对被测材料的介电特性非常敏感,因此样品和探头之间的任何小间隙都会引起测量误差。制备样品的困难在于精确切割和加工的必要性。这导致研究人员寻找易于生产,对样品制备的要求低并且探针与样品之间紧密接触的新探针[2〜4]。

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