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Resonant tunneling structures to significantly reduce the voltage drop in contacting pZnSe layer in blue-green lasers: simulation of voltage-current behavior

机译:共振隧穿结构可显着降低蓝绿色激光器中接触pZnSe层的电压降:电压-电流行为的仿真

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Abstract: This paper describes the usage of a novel asymmetric resonant tunneling structure (RTS) to obtain low voltage drop contacts to pZnSe and other wide energy gap semiconductors. Generally, the contact to p-ZnSe is achieved by the formation of a Schottky barrier or by forming a graded layer interface to pZnSe. These techniques have been employed in fabricating ZnSe based blue-green lasers, reported during the past few years using structures grown by Molecular Beam Epitaxy. Most of these approaches result in contact voltage drops ranging from 6-30 volts for a typical current above laser threshold. In the case of pGaAs-pZnSe (or pZnCdSe) interface, the presence of a large valence energy band offset results in high voltage drop due to a rectifying interface. The use of asymmetric resonant tunneling structure(s) at these heterointerfaces is shown to result in a significantly low (0.4 volts) voltage drops at current densities above threshold ($APEQ 600 A/Cm$+2$/). The incorporation of asymmetric resonant tunneling structures is also proposed for lasers on InP substrates. It is a generic technique which can be used for realizing low resistance contacts in material systems where standard contact techniques produce poor results. This technique is applicable for both p- and n-type heterojunction interfaces.!18
机译:摘要:本文介绍了如何使用新型不对称共振隧穿结构(RTS)获得与pZnSe和其他宽能隙半导体的低压降接触。通常,通过形成肖特基势垒或通过形成与pZnSe的梯度层界面来实现与p-ZnSe的接触。这些技术已用于制造基于ZnSe的蓝绿色激光器,在过去的几年中,使用分子束外延生长的结构进行了报道。对于高于激光阈值的典型电流,大多数这些方法都会导致接触电压下降6-30伏。在pGaAs-pZnSe(或pZnCdSe)界面的情况下,大价能带偏移的存在会由于整流界面而导致高电压降。在这些异质界面上使用非对称谐振隧穿结构可导致在高于阈值($ APEQ 600 A / Cm $ + 2 $ /)的电流密度下产生极低的电压降(0.4伏)。还提出了将非对称共振隧穿结构并入InP衬底上的激光器。这是一种通用技术,可用于在标准接触技术产生较差结果的材料系统中实现低电阻接触。此技术适用于p型和n型异质结界面!18

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