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A distributed globally replaceable redundancy scheme for sub-half micron ULSI memories and beyond

机译:分布式全球可更换冗余冗余方案,用于子半微米ULSI存储器及以后

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A Distributed Globally Replaceable Redundancy (DGR) scheme has been developed, which realizes a higher optimization of trade-off between yield and chip size. A newly developed yield simulator has demonstrated the effectiveness of the DGR scheme.
机译:开发了分布式全球可更换冗余(DGR)方案,这实现了屈服和芯片尺寸之间的折衷优化。新开发的产量模拟器已经证明了DGR方案的有效性。

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