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Session on the measurement of dielectric properties at elevated temperatures, introduction

机译:在升高温度下测量介电性能的会议,引言

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This session is concerned with the measurement of dielectric properties of electrical insulation at temperatures which are elevated above the normal room ambient temperature. The three papers which follow will discuss techniques utilized to measure specific properties. We shall now define the properties, discuss the reason why it is desirable to perform measurement at elevated temperature, review the activities of the American Society for Testing and Materials (ASTM) in this field, and examine the need for this session.
机译:本次会议涉及在高于正常室环境温度的温度下测量电绝缘的电介质特性。 遵循的三篇论文将讨论用于测量特定性质的技术。 我们现在将定义属性,讨论理想的原因,希望在升高的温度下进行测量,审查该领域的测试和材料(ASTM)的活动,并检查本次会议的需求。

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