首页> 外文会议> >ANALYSIS ON TECHNOLOGY OF INSTRUMENT AND A SUPERFICIAL VIEW IN THE FUTURE
【24h】

ANALYSIS ON TECHNOLOGY OF INSTRUMENT AND A SUPERFICIAL VIEW IN THE FUTURE

机译:仪器技术分析及未来展望

获取原文
获取原文并翻译 | 示例

摘要

With a brief review of the evolution of the test instrument and in-depth analysis of major problems concerning it, the paper points out information integrity and open architecture are the core of the problems, then goes on to propose a new concept of the Instrument on Network (ION) with “Measure and Control Network” plus “sensors” as its basic form, capable of information integrity and open architecture, and finally expounds some basic thinking of ION to solve problems of the test instrument, open and share data resources and interconnect instrument resources in coordination.
机译:在对测试仪器的发展进行简要回顾并对其主要问题进行深入分析之后,本文指出了信息完整性和开放式体系结构是问题的核心,然后提出了一种新的测试仪器概念。以“测控网络”加“传感器”为基本形式的网络(ION),具有信息完整性和开放架构的能力,最后阐述了ION解决测试仪器,开放和共享数据资源以及解决问题的一些基本思路。相互协调仪器资源。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号