Reducing accelerated test time: use of vibration loading to accelerate aging damage

摘要

A Physics-of-Failure approach to accelerated testing is used to experimentally demonstrate acceleration of aging tests using vibration loading. Surface mount daisy-chained circuit cards were aged in an accelerated manner using temperature, pressure and moisture loading to simulate strage conditions. Failure mechanisms of interest are intermetallic growth and corrosion. Random vibration tests were conducted on both aged and control (unconditioned) specimens. Failure data and failure analysis results are compared for the aged and unconditioned specimens and an evaluation is made of the feasibility of using vibration loading to permit early detection of aging caused by conventional storage tests. Quantitative calculations are made of domage due to aging for a specific specimen to illustrate the methodology. Potential limitations are pointed otu and possible applications in the field of accelerated screening are explored.