Design and Test of a Novel Higher Harmonic Imaging AFM Probe with a Dedicated Second Cantilever for Harmonic Amplification

摘要

We report on design, fabrication and initial testing of a new higher harmonic imaging atomic force microscopy (AFM) probe for the characterization of materials at the nanoscale. In contrast to previous designs [3],[4], this probe employs a dedicated second cantilever not only to amplify the desired higher harmonic, but also to suppress the actuation movement. With these measures the amplitudes of the actuation and the higher harmonic are brought closer together on the second cantilever, which is very advantageous for single-channel readout applications.