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Fast techniques for standby leakage reduction in MTCMOS circuits

机译:减少MTCMOS电路中待机泄漏的快速技术

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Technology scaling causes subthreshold leakage currents to increase exponentially. Therefore, effective leakage minimization techniques must be designed. In addition, for a true low-power solution in system-on-chip (SoC) design, it has to be tightly integrated into the main design environment. This paper presents two design techniques to effectively solve the sleep transistor sizing and distribution problem in MTCMOS circuits. The introduced first-fit and set-covering approaches achieve lower leakage at an order of magnitude reduction in CPU time compared with other techniques in the literature. In addition, an automatic MTCMOS design environment is developed and integrated into the Canadian Microelectronics Corporation (CMC) digital ASIC design flow.
机译:技术缩放导致亚阈值泄漏电流呈指数增长。因此,必须设计有效的泄漏最小化技术。此外,对于真正的片上系统(SoC)设计中的低功耗解决方案,必须将其紧密集成到主要设计环境中。本文提出了两种设计技术,可以有效解决MTCMOS电路中睡眠晶体管的尺寸和分布问题。与文献中的其他技术相比,引入的首次拟合和集合覆盖方法可在CPU时间减少一个数量级的情况下实现更低的泄漏。此外,还开发了一种自动MTCMOS设计环境,并将其集成到加拿大微电子公司(CMC)的数字ASIC设计流程中。

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