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A Nanowatt Successive Approximation ADC with Offset Correction for Implantable Sensor Applications

机译:具有偏移校正的纳瓦级逐次逼近型ADC,适用于可植入传感器应用

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An 8-bit successive approximation analog-to-digital converter (ADC) with offset correction circuitry is presented for implantable sensor applications. The ADC is designed in a 0.13mum CMOS process technology and operates with voltage supplies down to 0.35 V using MOSFETs operating in their sub-threshold region of operation. Sample rates of 60kS/s are achieved with an INL and DNL of approximately 0.26LSB and 0.35LSB respectively. The SAR ADC achieves 10.7pJ/cycle operating at 20 kS/s with a 0.4 V supply. An offset correction circuit is included to dynamically minimize the offset voltage on the comparator.
机译:提出了一种具有失调校正电路的8位逐次逼近型模数转换器(ADC),适用于可植入传感器应用。该ADC采用0.13μmCMOS工艺技术设计,并通过在其亚阈值工作区域内工作的MOSFET在低至0.35 V的电压下工作。 INL和DNL分别约为0.26LSB和0.35LSB时,采样率达到60kS / s。 SAR ADC在0.4 V电源下以20 kS / s的速度实现了10.7pJ /周期的工作。包含一个失调校正电路,以动态最小化比较器上的失调电压。

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